Dr Scott Findlay - Researcher Profile

Biography

Scott works in the School of Physics at Monash University as a QEII Fellow

 

 

Scott’s research areas of interest are:

My research interests centre around developing techniques for atomic resolution imaging of materials in transmission electron microscopy and scanning transmission electron microscopy. This requires a detailed analysis of the elastic and inelastic scattering behaviour of fast electrons moving through material specimens. Using theoretical modelling and numerical simulation, I work closely with experimental collaborators to tease out the maximum of scientific information from experimental microscopy images.

Topics of current, particular interest include:

• Establishing an "absolute scale" such that the comparison of experimentally recorded and theoretically calculated intensities can be used to count the number of atoms in a column of atoms.
• Developing the recent technique of annular bright field imaging for the direct imaging of light elements using scanning transmission electron microscopy.
• Using a combination of simultaneously acquired images for novel imaging possibilities.
• Adapting simulations to non-periodic specimens: grain boundaries, few atom impurities, defects.

BSc (Hons), Physics, Completed 2001, The University of Melbourne.

PhD (Physics), Complete 2005, The University of Melbourne

Post-doctoral Research Fellow, The University of Melbourne, 2005–2007.

Japan Society for the Promotion of Science Reserach Fellow, The University of Tokyo, 2007–2009.

Principal Researcher, The University of Tokyo, 2010–2011.

QEII Fellow, Monash University, 2011–present.

 

Qualifications

DOCTOR OF PHILOSOPHY

Institution: University of Melbourne

Year awarded: 2005

Publications

Book Chapters

Allen, L., Findlay, S., Oxley, M., 2011, Simulation and interpretation of images, in Scanning Transmission Electron Microscopy, eds S J Pennycook and P D Nellist, Springer, USA, pp. 247-289.

Journal Articles

Feng, B., Hojo, H., Mizoguchi, T., Ohta, H., Findlay, S., Sato, Y., Shibata, N., Yamamoto, T., Ikuhara, Y., 2012, Atomic structure of a Sigma 3 [110]/(111) grain boundary in CeO2, Applied Physics Letters [P], vol 100, issue 7, American Institute of Physics, College Park USA, pp. 1-3.

Shibata, N., Findlay, S., Kohno, Y., Sawada, H., Kondo, Y., Ikuhara, Y., 2012, Differential phase-contrast microscopy at atomic resolution, Nature Physics [P], vol 8, issue 8, Nature Publishing Group, London UK, pp. 611-615.

Rossell, M., Ramasse, Q.M., Findlay, S., Rechberger, F., Erni, R., Niederberger, M., 2012, Direct imaging of dopant clustering in metal-oxide nanoparticles, Acs Nano [P], vol 6, issue 8, Americal Chemical Society, Washington USA, pp. 7077-7083.

Ruben, G., Cosgriff, E.C., D'Alfonso, A.J., Findlay, S., LeBeau, J.M., Allen, L.J., 2012, Interface location by depth sectioning using a low-angle annular dark field detector, Ultramicroscopy [P], vol 113, issue 1, Elsevier BV, Amsterdam Netherlands, pp. 131-138.

Lugg, N.R., Haruta, M., Neish, M., Findlay, S., Mizoguchi, T., Kimoto, K., Allen, L.J., 2012, Removing the effects of elastic and thermal scattering from electron energy-loss spectroscopic data, Applied Physics Letters [P], vol 101, issue 18, American Institute of Physics, Maryland USA, pp. 1-4.

Kobayashi, S., Findlay, S., Shibata, N., Mizoguchi, T., Sato, Y., Okunishi, E., Ikuhara, Y., Yamamoto, T., 2012, Simultaneous visualization of oxygen vacancies and the accompanying cation shifts in a perovskite oxide by combining annular imaging techniques, Applied Physics Letters [P], vol 100, issue 19, American Institute of Physics, College Park USA, pp. 1-5.

Findlay, S., Azuma, S., Shibata, N., Okunishi, E., Ikuhara, Y., 2011, Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundary, Ultramicroscopy [P], vol 111, issue 4, Elsevier BV, The Netherlands, pp. 285-289.

Huang, R., Ikuhara, Y., Mizoguchi, T., Findlay, S., Kuwabara, A., Fisher, C., Moriwake, H., Oki, H., Hirayama, T., Ikuhara, Y., 2011, Oxygen-vacancy ordering at surfaces of lithium manganese(III,IV) oxide spinel nanoparticles, Angewandte Chemie - International Edition [P], vol 50, issue 13, Wiley-Blackwell, USA, pp. 3053-3057.

Findlay, S., Lugg, N., Shibata, N., Allen, L., Ikuhara, Y., 2011, Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: A theoretical study, Ultramicroscopy [P], vol 111, issue 8, Elsevier BV, The Netherlands, pp. 1144-1154.

Huang, R., Hitosugi, T., Findlay, S., Fisher, C., Ikuhara, Y., Moriwake, H., Oki, H., Ikuhara, Y., 2011, Real-time direct observation of Li in LiCoO2 cathode material, Applied Physics Letters [P], vol 98, issue 5, American Institute of Physics, USA, pp. 1-3.

Lugg, N., Findlay, S., Shibata, N., Mizoguchi, T., D'Alfonso, A., Allen, L., Ikuhara, Y., 2011, Scanning transmission electron microscopy imaging dynamics at low accelerating voltages, Ultramicroscopy [P], vol 111, issue 8, Elsevier BV, The Netherlands, pp. 999-1013.

Lee, H., Findlay, S., Mizoguchi, T., Ikuhara, Y., 2011, The effect of vacancies on the annular dark field image contrast of grain boundaries: A SrTiO(3) case study, Ultramicroscopy [P], vol 111, issue 11, Elsevier BV, The Netherlands, pp. 1531-1539.

Forbes, B., D'Alfonso, A., Findlay, S., Van Dyck, D., LeBeau, J., Stemmer, S., Allen, L., 2011, Thermal diffuse scattering in transmission electron microscopy, Ultramicroscopy [P], vol 111, issue 12, Elsevier BV, The Netherlands, pp. 1670-1680.

Hojo, H., Mizoguchi, T., Ohta, H., Findlay, S., Shibata, N., Yamamoto, T., Ikuhara, Y., 2010, Atomic structure of a CeO2 grain boundary: The role of oxygen vacancies, Nano Letters [P], vol 10, issue 11, American Chemical Society, USA, pp. 4668-4672.

Findlay, S., Saito, T., Shibata, N., Sato, Y., Matsuda, J., Asano, K., Akiba, E., Hirayama, T., Ikuhara, Y., 2010, Direct imaging of hydrogen within a crystalline environment, Applied Physics Express [P], vol 3, issue 11, Institute of Pure and Applied Physics, Japan, pp. 116603-1-116603-3.

Findlay, S., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Ikuhara, Y., 2010, Dynamics of annular bright field imaging in scanning transmission electron microscopy, Ultramicroscopy [P], vol 110, issue 7, Elsevier BV, Netherlands, pp. 903-923.

Lugg, N., Freitag, B., Findlay, S., Allen, L., 2010, Energy-filtered transmission electron microscopy based on inner-shell ionization, Ultramicroscopy [P], vol 110, issue 8, Elsevier BV, Netherlands, pp. 981-990.

Azuma, S., Shibata, N., Findlay, S., Mizoguchi, T., Yamamoto, T., Ikuhara, Y., 2010, HAADF-STEM observations of a sum13 grain boundary in alpha-Al2O3 from two orthogonal directions, Philosophical Magazine Letters [P], vol 90, issue 8, Taylor & Francis Ltd, UK, pp. 539-546.

Cosgriff, E., Nellist, P., D'Alfonso, A., Findlay, S., Behan, G., Wang, P., Allen, L., Kirkland, A., 2010, Image contrast in aberration-corrected scanning confocal electron microscopy, Advances In Imaging And Electron Physics [P], vol 162, Academic Press, USA, pp. 45-76.

Shibata, N., Kohno, Y., Findlay, S., Sawada, H., Kondo, Y., Ikuhara, Y., 2010, New area detector for atomic-resolution scanning transmission electron microscopy, Journal Of Electron Microscopy [P], vol 59, issue 6, Oxford University Press, Japan, pp. 473-479.

LeBeau, J., Findlay, S., Allen, L., Stemmer, S., 2010, Position averaged convergent beam electron diffraction: Theory and applications, Ultramicroscopy [P], vol 110, issue 2, Elsevier BV, Netherlands, pp. 118-125.

Findlay, S., Shibata, N., Azuma, S., Ikuhara, Y., 2010, Prospects for 3D imaging of dopant atoms in ceramic interfaces, Journal Of Electron Microscopy [P], vol 59, issue 1, Oxford University Press, Japan, pp. S29-S38.

Forbes, B., Martin, A., Findlay, S., D'Alfonso, A., Allen, L., 2010, Quantum mechanical model for phonon excitation in electron diffraction and imaging using a Born-Oppenheimer approximation, Physical Review B - Condensed Matter and Materials Physics [P], vol 82, issue 10, American Physical Society, USA, pp. 104103-1-104103-8.

LeBeau, J., Findlay, S., Allen, L., Stemmer, S., 2010, Standardless atom counting in scanning transmission electron microscopy, Nano Letters [P], vol 10, issue 11, American Chemical Society, USA, pp. 4405-4408.

Shibata, N., Findlay, S., Azuma, S., Mizoguchi, T., Yamamoto, T., Ikuhara, Y., 2009, Atomic-scale imaging of individual dopant atoms in a buried interface, Nature Materials [P], vol 8, issue 8, Nature Publishing Group, UK, pp. 654-658.

LeBeau, J., Findlay, S., Wang, X., Jacobson, A., Allen, L., Stemmer, S., 2009, High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment, Physical Review B - Condensed Matter and Materials Physics [P], vol 79, issue 21, American Physical Society, USA, pp. 214110-1-214110-6.

Shibata, N., Goto, A., Matsunaga, K., Mizoguchi, T., Findlay, S., Yamamoto, T., Ikuhara, Y., 2009, Interface structures of gold nanoparticles on TiO2 (110), Physical Review Letters [P], vol 102, issue 13, American Physical Society, USA, pp. 136105-1-136105-4.

Martin, A., Findlay, S., Allen, L., 2009, Model of phonon excitation by fast electrons in a crystal with correlated atomic motion, Physical Review B - Condensed Matter and Materials Physics [P], vol 80, issue 2, American Physical Society, USA, pp. 024308-1-024308-14.

LeBeau, J., D'Alfonso, A., Findlay, S., Stemmer, S., Allen, L., 2009, Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images, Physical Review B - Condensed Matter and Materials Physics [P], vol 80, issue 17, American Physical Society, USA, pp. 174106-1-174106-5.

Findlay, S., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Yamamoto, T., Ikuhara, Y., 2009, Robust atomic resolution imaging of light elements using scanning transmission electron microscopy, Applied Physics Letters [P], vol 95, issue 19, American Institute of Physics, USA, pp. 191913-1-191913-3.

Witte, C., Findlay, S., Oxley, M., Rehr, J., Allen, L., 2009, Theory of dynamical scattering in near-edge electron energy loss spectroscopy, Physical Review B - Condensed Matter and Materials Physics [P], vol 80, issue 18, American Physical Society, USA, pp. 184108-1-184108-15.

Findlay, S., Shibata, N., Ikuhara, Y., 2009, What atomic resolution annular dark field imaging can tell us about gold nanoparticles on TiO 2 (1 1 0), Ultramicroscopy [P], vol 109, issue 12, Elsevier BV, Netherlands, pp. 1435-1446.

Findlay, S., Klenov, D., Stemmer, S., Allen, L., 2008, Atomic number contrast in high angle annular dark field imaging of crystals, Materials Science and Technology [P], vol 24, issue 6, Maney Publishing, UK, pp. 660-666.

Imaeda, M., Mizoguchi, T., Sato, Y., Lee, H., Findlay, S., Shibata, N., Yamamoto, T., Ikuhara, Y., 2008, Atomic structure, electronic structure, and defect energetics in [001](310)sum5 grain boundaries of SrTiO3 and BaTiO3, Physical Review B - Condensed Matter and Materials Physics [P], vol 78, issue 24, American Physical Society, USA, pp. 245320-1-245320-12.

Wang, P., D'Alfonso, A., Findlay, S., Allen, L., Bleloch, A., 2008, Contrast reversal in atomic-resolution chemical mapping, Physical Review Letters [P], vol 101, issue 23, American Physical Society, USA, pp. 236102-1-236102-4.

Shibata, N., Goto, A., Choi, S., Mizoguchi, T., Findlay, S., Yamamoto, T., Ikuhara, Y., 2008, Direct imaging of reconstructed atoms on TiO2 (110) surfaces, Science [P], vol 322, issue 5901, American Association for the Advancement of Science, USA, pp. 570-573.

Findlay, S., Oxley, M., Allen, L., 2008, Modeling atomic-resolution scanning transmission electron microscopy images, Microscopy And Microanalysis [P], vol 14, issue 1, Cambridge University Press, UK, pp. 48-59.

Dwyer, C., Findlay, S.D., Allen, L.J., 2008, Multiple elastic scattering of core-loss electrons in atomic resolution imaging, Physical Review B, vol 77, issue 18, The American Physical Society, Maryland, USA, pp. 184107-1-184107-8.

LeBeau, J., Findlay, S., Allen, L., Stemmer, S., 2008, Quantitative atomic resolution scanning transmission electron microscopy, Physical Review Letters [P], vol 100, issue 20, American Physical Society, USA, pp. 206101-1-206101-4.

Cosgriff, E., D'Alfonso, A., Allen, L., Findlay, S., Kirkland, A., Nellist, P., 2008, Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part I:. Elastic scattering, Ultramicroscopy [P], vol 108, issue 12, Elsevier BV, Netherlands, pp. 1558-1566.

D'Alfonso, A., Cosgriff, E., Findlay, S., Behan, G., Kirkland, A., Nellist, P., Allen, L., 2008, Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering, Ultramicroscopy [P], vol 108, issue 12, Elsevier BV, Netherlands, pp. 1567-1578.

D'Alfonso, A., Findlay, S., Oxley, M., Allen, L., 2008, Volcano structure in atomic resolution core-loss images, Ultramicroscopy [P], vol 108, issue 7, Elsevier BV, Netherlands, pp. 677-687.

D'Alfonso, A., Findlay, S., Oxley, M., Pennycook, S., van Bentham, K., Allen, L., 2007, Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopy, Ultramicroscopy [P], vol 108, issue 1, Elsevier BV, Netherlands, pp. 17-28.

Findlay, S., Schattschneider, P., Allen, L., 2007, Imaging using inelastically scattered electrons in CTEM and STEM geometry, Ultramicroscopy [P], vol 108, issue 1, Elsevier BV, Netherlands, pp. 58-67.

Klenov, D., Findlay, S., Allen, L., Stemmer, S., 2007, Influence of orientation on the contrast of high-angle annular dark-field images of silicon, Physical Review B - Condensed Matter and Materials Physics [P], vol 76, issue 1, American Physical Society, USA, pp. 014111-1-014111-7.

Oxley, M., Varela, M., Pennycook, T., van Bentham, K., Findlay, S., D'Alfonso, A., Allen, L., Pennycook, S., 2007, Interpreting atomic-resolution spectroscopic images, Physical Review B - Condensed Matter and Materials Physics [P], vol 76, issue 6, American Physical Society, USA, pp. 064303-1-064303-8.

Bosman, M., Keast, V., Garcia-Munoz, J., D'Alfonso, A.J., Findlay, S., Allen, L., 2007, Two-dimensional mapping of chemical information at atomic resolution, Physical Review Letters [P], vol 99, issue 8, American Physical Society, USA, pp. 086102-1-086102-4.

Allen, L., Findlay, S., Oxley, M., Witte, C., Zaluzec, N., 2006, Channeling effects in high-angular-resolution electron spectroscopy, Physical Review B - Condensed Matter and Materials Physics [P], vol 73, issue 9, American Physical Society, USA, pp. 094104-1-094104-11.

Allen, L., Findlay, S., Oxley, M., Witte, C., Zaluzec, N., 2006, Modelling high-resolution electron microscopy based on core-loss spectroscopy, Ultramicroscopy [P], vol 106, issue 11-12, Elsevier BV, Netherlands, pp. 1001-1011.

Martin, A., Chen, F., Hseih, W., Kai, J., Findlay, S., Allen, L., 2006, Spatial incoherence in phase retrieval based on focus variation, Ultramicroscopy [P], vol 106, issue 10, Elsevier BV, Netherlands, pp. 914-924.

van Bentham, K., Lupini, A., Oxley, M., Findlay, S., Allen, L., Pennycook, S., 2006, Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy, Ultramicroscopy [P], vol 106, issue 11-12, Elsevier BV, Netherlands, pp. 1062-1068.

Findlay, S., Oxley, M., Pennycook, S., Allen, L., 2005, Modelling imaging based on core-loss spectroscopy in scanning transmission electron microscopy, Ultramicroscopy [P], vol 104, issue 2, Elsevier BV, Netherlands, pp. 126-140.

Findlay, S., 2005, Quantitative structure retrieval using scanning transmission electron microscopy, Acta Crystallographica Section A: Foundations of Crystallography [P], vol 61, issue 4, Wiley-Blackwell Publishing, USA, pp. 397-404.

van Bentham, K., Lupini, A., Kim, M., Baik, H., Doh, S., Lee, J., Oxley, M., Findlay, S., Allen, L., Luck, J., Pennycook, S., 2005, Three-dimensional imaging of individual hafnium atoms inside a semiconductor device, Applied Physics Letters [P], vol 87, issue 3, American Institute of Physics, USA, pp. 1-3.

Conference Proceedings

LeBeau, J.M., Findlay, S., Allen, L.J., Stemmer, S., 2012, Quantitative STEM: experimental methods and applications, Electron Microscopy and Analysis Group Conference 2011, EMAG 2011, 06 September 2011 to 09 Septemebr 2011, Institute of Physics Publishing Ltd, Bristol UK, pp. 1-5.

Allen, L.J., D'Alfonso, A.J., Forbes, B.D., Findlay, S., LeBeau, J.M., Stemmer, S., 2012, Quantitative transmission electron microscopy at atomic resolution, Electron Microscopy and Analysis Group Conference 2011, EMAG 2011, 06 September 2011 to 09 Septemebr 2011, Institute of Physics Publishing Ltd, Bristol UK, pp. 1-4.

Allen, L., D'Alfonso, A., Findlay, S., LeBeau, J., Lugg, N., Stemmer, S., 2010, Elemental mapping in scanning transmission electron microscopy, Journal of Physics: Conference Series, 8 September 2009 to 11 September 2009, IOP Publishing Ltd, Bristol UK, pp. 1-6.

D'Alfonso, A., Cosgriff, E., Findlay, S., Kirkland, A., Nellist, P., Oxley, M., Allen, L., 2008, Depth sectioning using electron energy loss spectroscopy, Journal of Physics: Conference Series, 3 September 2007 to 7 September 2007, IOP Publishing Ltd, UK, pp. 1-4.

Cosgriff, E., D'Alfonso, A., Allen, L., Findlay, S., Kirkland, A., Nellist, P., 2008, Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy, Journal of Physics: Conference Series, 3 September 2007 to 7 September 2007, IOP Publishing Ltd, UK, pp. 1-4.