Dr Philip Nakashima - Researcher Profile

We do not have a photograph of this person yet.

Address

Ctr of Excell Design in Light Metals
Faculty of Engineering, Clayton

Biography

Philip works in the Faculty of Engineering at Monash University as a Research Fellow.

Qualifications

PHYSICS
Institution: University of Western Australia
Year awarded: 2003
ENGINEERING
Institution: University of Western Australia
Year awarded: 1998
CHEMICAL PHYSICS
Institution: University of Western Australia
Year awarded: 1996

Publications

Journal Articles

Bjorge, R., Dwyer, C., Weyland, M., Nakashima, P., Marioara, C., Andersen, S., Etheridge, J., Holmestad, R., 2012, Aberration-corrected scanning transmission electron microscopy study of beta'-like precipitates in an A1-Mg-Ge alloy, Acta Materialia [P], vol 60, issue 6-7, Pergamon-Elsevier Science Ltd, Oxford UK, pp. 3239-3246.

Nakashima, P., 2012, In situ quantification of noise as a function of signal in digital images, Optics Letters [P], vol 37, issue 6, Optical Society of America, USA, pp. 1023-1025.

Nakashima, P., Moodie, A., Etheridge, J., 2011, A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns, Ultramicroscopy [P], vol 111, issue 7, Elsevier Science BV, The Netherlands, pp. 841-846.

Bjorge, R., Nakashima, P., Marioara, C., Andersen, S., Muddle, B., Etheridge, J., Holmestad, R., 2011, Precipitates in an Al-Mg-Ge alloy studied by aberration-corrected scanning transmission electron micrscopy, Acta Materialia [P], vol 59, issue 15, Pergamon-Elsevier Science Ltd, Oxford UK, pp. 6103-6109.

Liu, A., Paganin, D., Bourgeois, L., Nakashima, P., 2011, Projected thickness reconstruction from a single defocused transmission electron microscope image of an amorphous object, Ultramicroscopy [P], vol 111, issue 8, Elsevier BV, The Netherlands, pp. 959-968.

Liu, A., Paganin, D., Bourgeois, L., Nakashima, P., Ott, R., Kramer, M., 2011, Quantitative microscopic measurement of void distribution in shear bands in Zr(66.7)Cu(33.3) metallic glass, Physical Review B - Condensed Matter and Materials Physics [P], vol 84, issue 9, American Physical Society, USA, pp. 1-7.

Nakashima, P., Smith, A., Etheridge, J., Muddle, B., 2011, The bonding electron density in aluminium, Science [P], vol 331, issue 6024, American Association for the Advancement of Science, USA, pp. 1583-1586.

Nakashima, P., Muddle, B., 2010, Differential convergent beam electron diffraction: Experiment and theory, Physical Review B - Condensed Matter and Materials Physics [P], vol 81, issue 11, American Physical Society, USA, pp. 1-10.

Nakashima, P., Muddle, B., 2010, Differential quantitative analysis of background structure in energy-filtered convergent-beam electron diffraction patterns, Journal Of Applied Crystallography [P], vol 43, issue 2, Wiley-Blackwell Publishing Inc, USA, pp. 280-284.

Erni, R., Rossell, M., Nakashima, P., 2010, Optimization of exit-plane waves restored from HRTEm through-focal series, Ultramicroscopy [P], vol 110, issue 2, Elsevier Science BV, The Netherlands, pp. 151-161.

Huang, Y., Ho, J., Wang, Z., Nakashima, P., Hill, A., Wang, H., 2009, Mesoporous carbon confined conversion of silica nanoparticles into zeolite nanocrystals, Microporous and Mesoporous Materials, vol 117, Elsevier Science BV, Netherlands, pp. 490-496.

Nakashima, P., Moodie, A.F., Etheridge, J., 2008, A practical guide to the measurement of structure phases and magnitudes by three-beam convergent beam electron diffraction, Ultramicroscopy, vol 108, Elsevier, Amsterdam, The Netherlands, pp. 901-910.

Nakashima, P., Moodie, A.F., Etheridge, J., 2007, Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patterns, Acta Crystallographica Section A, vol 63, issue 5, International Union of Crystallography, Oxford, UK, pp. 387-390.

Nakashima, P., 2007, Thickness difference: a new filtering tool for quantitative electron diffraction, Physical Review Letters, vol 99, issue 12, The American Physical Society, Maryland, USA, pp. 125506-1-125506-4.

Kral, M., Nakashima, P.N., Mitchell, D., 2006, Electron microscope studies of AI-Fe-Si intermetallics in an AI-11 Pct Si alloy, Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science, vol 37, issue 6, Minerals Metals Materials Soc, Warrendale PA USA, pp. 1987-1997.

Streltsov, V.A., Nakashima, P.N., Sobolev, A.N., Ozerov, R.P., 2005, Crystal structure study of a beta'-copper vanadium bronze, CuxV2O5 (x = 0.63), by X-ray and convergent beam electron diffraction, Acta Crystallographica B, vol 61, Blackwell Munksgaard, Denmark, pp. 17-24.

Nakashima, P.N., 2005, Improved Quantitative CBED Structure-Factor Measurement by Refinement of Nonlinear Geometric Distortion Corrections, Journal of Applied Crystallography, vol 38, Blackwell Munksgaard, Denmark, pp. 374-376.

Streltsov, V.A., Nakashima, P., Johnson, A.W.S., 2003, A combination methods of charge density measurement in hard materials using accurate, quantitative electron and X-ray diffraction: The -AI2O3 case, Microscopy and Microanalysis, vol 9, issue 5, Cambridge University Press, New York USA, pp. 419-427.

Nakashima, P.N.H., Johnson, A.W.S., 2003, Measuring the PSF from aperture images of arbitrary shapean algorithm, Ultramicroscopy, vol 94, issue 2, Elsevier, Amsterdam The Netherlands, pp. 135-148.

Streltsov, V.A., Nakashima, P.N.H., Johnson, A.W.S., 2001, Charge density analysis from complementary high energy synchrotron X-ray and electron diffraction data, Journal of Physics and Chemistry of Solids, vol 62, issue 12, Pergamon-Elsevier Science Ltd, Oxford England, pp. 2109-2117.

Conference Proceedings

Nakashima, P., Smith, A., Qiu, C., Muddle, B., 2010, Chemical bonding in aluminum and its influence on precipitates in AI alloys, Proceedings of the 12th International Conference on Aluminium Alloys, 5 September 2010 to 9 September 2010, The Japan Institute of Light Metals, Japan, pp. 1426-1431.

Bjorge, R., Nakashima, P., Marioara, C., Andersen, S., Muddle, B., Etheridge, J., Holmestad, R., 2010, Precipitate/matrix interface in an AI-Mg-Ge alloy studied by annular dark-field scanning transmission electron microscopy, Proceedings of the 12th International Conference on Aluminium Alloys, 5 September 2010 to 9 September 2010, Japan Institute of Light Metals, Japan, pp. 1391-1396.

Bourgeois, L.N., Weyland, M., Nakashima, P., Muddle, B.C., 2009, Anatomy of a void in an aluminium-copper-tin alloy, Abstract Book of the Joint Conference of the Asian Crystallographic Association and Chinese Crystallographic Society, 22nd -25th October 2009, The Asian Crystallographic Association and Chinese Crystallographic Society, Beijing, China, p. 60.

Nakashima, P., Moodie, A.F., Etheridge, J., 2008, Atomic structure determination by observing structural phase in 3-beam CBED patterns, 14th European Microscopy Congress, Volume 1: Instrucmentation and Methods, 1st - 5th September 2008, Springer-Verlag, Berlin, Germany, pp. 219-220.

Nakashima, P., 2008, Can absorption be quantitatively negated in experimental CBED data?, Through the Looking Glass - The 20th Australian Conference on Microscopy and Microanalysis and the 4th Congress of the International Union of Microbeam Analysis Societies (Proceedings), 10-15th February 2008, The Australian Microscopy and Microanalysis Society Inc., Melbourne, Victoria, Australia, p. 140.

Nakashima, P., 2008, Differential electron diffraction, Ultra-High Resolution TEM: Imaging and Diffraction, 9th December 2008, Monash Centre for Electron Microscopy, Monash University, Melbourne, Victoria, Australia, pp. 17-18.

Etheridge, J., Nakashima, P., Moodie, A.F., 2008, Direct observation of structural phase in CBED patterns - applications to structure determination, XXI Congress of the International Union of Crystallography Congress and General Assembly Book of Abstracts, 23rd - 31st August 2008, International Union of Crystallography, Chester, UK, p. C202.

Shih, J.C., Nakashima, P., Suzuki, K., Etheridge, J., 2008, Evidence of heterogeneous nucleation of Nd2Fe14B upon crystallisation of Nd-Fe-B melt-spun ribbons, XXI Congress of the International Union of Crystallography Congress and General Assembly Book of Abstracts, 23rd - 31st August 2008, International Union of Crystallography, Chester, UK, p. C511.

Nakashima, P., Bourgeois, L.N., Muddle, B.C., 2008, Interrogation of void-like objects in AI-Cu-Sn, ARC Centre of Excellence for Design in Light Metals Annual Workshop 25-26 November 2008, 25th - 26th November 2008, ARC Centre of Excellence for Design in Light Metals, Melbourne, Australia, p. 1.

Nakashima, P., Moodie, A.F., Etheridge, J., 2008, Solving the phase problem and determining structure amplitudes by inspecting 3-Beam CBED patterns, Through the Looking Glass - The 20th Australian Conference on Microscopy and Microanalysis and the 4th Congress of the International Union of Microbeam Analysis Societies (Proceedings), 10th - 15th February 2008, The Australian Microscopy and Microanalysis Society Inc., Melbourne, Victoria, Australia, p. 295.

Etheridge, J., Maunders, C., Moodie, A.F., Nakashima, P., Rossouw, C.J., 2006, Novel CBED Methods for Structural Analysis, Microscopy and MIcroanalysis, 30th July - 3rd August 2006, CUP, Cambridge UK, pp. 792CD-793CD.

Postgraduate Research Supervisions

Current Supervision

Program of Study:
(DOCTORATE BY RESEARCH).
Thesis Title:
New Methods for Measuring Crystal Structure and Bonding By "3-Beam" Convergent Electron Diffraction.
Supervisors:
Etheridge, J (Main), Nakashima, P (Associate).