Prof Joanne Etheridge - Researcher Profile

Biography

Joanne works in the Office of the Snr DVC & DVC (Research) at Monash University as an Associate Professor.

Qualifications

DOCTOR OF PHILOSOPHY

Institution: Melbourne

Year awarded: 1994

SCIENCE (HONS)

Institution: UNIVERSITY OF MELBOURNE

Year awarded: 1988

Publications

Journal Articles

Zheng, C., Etheridge, J., 2013, Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction, Ultramicroscopy [P], vol 125, Elsevier, Amsterdam Netherlands, pp. 49-58.

Bjorge, R., Dwyer, C., Weyland, M., Nakashima, P., Marioara, C., Andersen, S., Etheridge, J., Holmestad, R., 2012, Aberration-corrected scanning transmission electron microscopy study of beta'-like precipitates in an A1-Mg-Ge alloy, Acta Materialia [P], vol 60, issue 6-7, Pergamon-Elsevier Science Ltd, Oxford UK, pp. 3239-3246.

Putkunz, C.T., D'Alfonso, A.J., Morgan, A.J., Weyland, M., Dwyer, C., Bourgeois, L.N., Etheridge, J., Roberts, A., Scholten, R.E., Nugent, K.A., Allen, L.J., 2012, Atom-scale ptychographic electron diffractive imaging of boron nitride cones, Physical Review Letters [P], vol 108, issue 7, American Physical Society, College Park USA, pp. 1-4.

Dwyer, C., Lazar, S., Chang, L., Etheridge, J., 2012, Image formation in the scanning transmission electron microscope using object-conjugate detectors, Acta Crystallographica Section A: Foundations of Crystallography [P], vol 68, issue 2, Wiley-Blackwell, Malden USA, pp. 196-207.

Bjorge, R., Andersen, S., Marioara, C., Etheridge, J., Holmestad, R., 2012, Scanning transmission electron microscopy investigation of an Al-Mg-Si-Ge-Cu alloy, Philosophical Magazine [P], vol 92, issue 32, Taylor & Francis, England UK, pp. 3983-3993.

Dwyer, C., Maunders, C., Zheng, C., Weyland, M., Tiemeijer, P., Etheridge, J., 2012, Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters, Applied Physics Letters [P], vol 100, issue 19, American Institute of Physics, Melville NY USA, pp. 1-4.

Nakashima, P., Moodie, A., Etheridge, J., 2011, A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns, Ultramicroscopy [P], vol 111, issue 7, Elsevier Science BV, The Netherlands, pp. 841-846.

Maunders, C., Dwyer, C., Tiemeijer, P., Etheridge, J., 2011, Practical methods for the measurement of spatial coherence-A comparative study, Ultramicroscopy [P], vol 111, issue 8, Elsevier B.V., The Netherlands, pp. 1437-1446.

Bjorge, R., Nakashima, P., Marioara, C., Andersen, S., Muddle, B., Etheridge, J., Holmestad, R., 2011, Precipitates in an Al-Mg-Ge alloy studied by aberration-corrected scanning transmission electron micrscopy, Acta Materialia [P], vol 59, issue 15, Pergamon-Elsevier Science Ltd, Oxford UK, pp. 6103-6109.

Nakashima, P., Smith, A., Etheridge, J., Muddle, B., 2011, The bonding electron density in aluminium, Science [P], vol 331, issue 6024, American Association for the Advancement of Science, USA, pp. 1583-1586.

Katz-Boon, H., Rossouw, C., Weyland, M., Funston, A., Mulvaney, P., Etheridge, J., 2011, Three-dimensional morphology and crystallography of gold nanorods, Nano Letters [P], vol 11, issue 1, American Chemical Society, Washington DC USA, pp. 273-278.

Radtke, G., Maunders, C., Saul, A., Lazar, S., Whitfield, H., Etheridge, J., Botton, G., 2010, Electronic structure and stability of hexagonal Ba3Ti 2RuO9, Physical Review B - Condensed Matter and Materials Physics [P], vol 81, issue 8, The American Physical Society, USA, pp. 1-10.

Dwyer, C., Erni, R., Etheridge, J., 2010, Measurement of effective source distribution and its importance for quantitative interpretation of STEM images, Ultramicroscopy [P], vol 110, issue 8, Elsevier BV, The Netherlands, pp. 952-957.

Nakashima, P., Moodie, A.F., Etheridge, J., 2008, A practical guide to the measurement of structure phases and magnitudes by three-beam convergent beam electron diffraction, Ultramicroscopy, vol 108, Elsevier, Amsterdam, The Netherlands, pp. 901-910.

Dwyer, C., Erni, R., Etheridge, J., 2008, Method to measure spatial coherence of subangstrom electron beams, Applied Physics Letters, vol 93, issue (Article no. 021115), American Institute of Physics, New York, USA, pp. 1-3.

Maunders, C., Whitfield, H.J., Hay, D.G., Etheridge, J., 2007, Electron diffraction and microscopy study of the structure and microstructure of the hexagonal perovskite Ba3Ti2MnO 9, Acta Crystallorgraphica Section B-Structural Science, vol 63, issue 3, Blackwell Publishing, Denmark, pp. 390-395.

Nakashima, P., Moodie, A.F., Etheridge, J., 2007, Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patterns, Acta Crystallographica Section A, vol 63, issue 5, International Union of Crystallography, Oxford, UK, pp. 387-390.

Rossouw, C.J., Maunders, C., Whitfield, H.J., Etheridge, J., 2006, CBED contrast in the lower order Laue zone, Ultramicroscopy, vol 106, issue 4-5, Elsevier, Netherland, pp. 439-448.

Darahanau, A.V., Benci, A., Nikulin, A.Y., Etheridge, J., Hester, J., Zaumseil, P., 2006, High spatial resolution mapping of partially strain-compensated SiGe:C films in the presence of postannealed defects, Journal of Applied Physics, vol 99, issue 11, American Institute of Physics, USA, pp. 113531-1-113531-6.

Maunders, C., Whitfield, H., Radtke, G., Botton, G.A., Lazar, S., Etheridge, J., 2005, High Resolution EELS Investigation of Hexagonal Transition Metal Perovskites, Microscopy and Microanalysis, vol 11, issue Suppl. 2, The Microscopy Society of America, Cambridge UK, pp. 738-739.

Maunders, C., Etheridge, J., Wright, N., Whitfield, H.J., 2005, Structure and microstructure of hexagonal Ba3Ti 2RuO9 by electron diffraction and microscopy, Acta Crystallographica B, vol 61, issue 2, Blackwell Publishing Ltd., Oxford UK, pp. 154-159.

Radtke, G., Maunders, C., Lazar, S., De Groot, J., Etheridge, J., Botton, G.A., 2005, The role of Mn in the electronic structure of Ba3Ti 2MnO9, Journal of Solid State Chemistry, vol 178, issue 11, Elsevier Inc., Orlando USA, pp. 3426-3430.

Botton, G.A., Wu, M.Y., Maunders, C., Etheridge, J., Whitfield, H.J., 2004, Detecting structural and bonding changes in EELS near-edge structures with a monochromated TEM, Microscopy and Microanalysis, vol 10, issue Supp. 2, Cambridge University Press, New York NY USA, pp. 86-87.

Dwyer, C., Etheridge, J., 2003, Scattering of A-scale electron probes in silicon, Ultramicroscopy, vol 96, issue 3-4, Elsevier Science BV, Amsterdam Netherlands, pp. 343-360.

Dwyer, C., Etheridge, J., 2001, Out-of-Zone Reflections in Coherent CBED Patterns, Journal of Physics: Conference Series, vol 168, Institute of Physics Publishing, Bristol UK, pp. 132-138.

Etheridge, J., Dwyer, C., 2001, Scattering of Electron Probes Focused within the Unit Cell, Journal of Physics: Conference Series, vol 168, Institute of Physics Publishing, Bristol UK, pp. 127-131.

Conference Proceedings

Bjorge, R., Marioara, C., Andersen, S., Weyland, M., Etheridge, J., Holmestad, R., 2012, Quantitative STEM Study of the [beta][prime] -Ge Phase in Al-Mg-Ge Alloys, Microscopy and Microanalysis, 29 July 2012 to 2 August 2012, Cambridge University Press, Cambridge UK, pp. 360-361.

Bjorge, R., Nakashima, P., Marioara, C., Andersen, S., Muddle, B., Etheridge, J., Holmestad, R., 2010, Precipitate/matrix interface in an AI-Mg-Ge alloy studied by annular dark-field scanning transmission electron microscopy, Proceedings of the 12th International Conference on Aluminium Alloys, 5 September 2010 to 9 September 2010, Japan Institute of Light Metals, Japan, pp. 1391-1396.

Etheridge, J., Dwyer, C., 2008, A method to measure the size of an angstrom-scale electron probe, Through the Looking Glass - The 20th Australian Conference on Microscopy and Microanalysis and the 4th Congress of the International Union of Microbeam Analysis Societies (Proceedings), 10th - 15th February 2008, The Australian Microscopy and Microanalysis Society Inc, Melbourne, Vic, Australia, pp. 141-142.

Nakashima, P., Moodie, A.F., Etheridge, J., 2008, Atomic structure determination by observing structural phase in 3-beam CBED patterns, 14th European Microscopy Congress, Volume 1: Instrucmentation and Methods, 1st - 5th September 2008, Springer-Verlag, Berlin, Germany, pp. 219-220.

Etheridge, J., Nakashima, P., Moodie, A.F., 2008, Direct observation of structural phase in CBED patterns - applications to structure determination, XXI Congress of the International Union of Crystallography Congress and General Assembly Book of Abstracts, 23rd - 31st August 2008, International Union of Crystallography, Chester, UK, p. C202.

Shih, J.C., Nakashima, P., Suzuki, K., Etheridge, J., 2008, Evidence of heterogeneous nucleation of Nd2Fe14B upon crystallisation of Nd-Fe-B melt-spun ribbons, XXI Congress of the International Union of Crystallography Congress and General Assembly Book of Abstracts, 23rd - 31st August 2008, International Union of Crystallography, Chester, UK, p. C511.

Maunders, C., Radtke, G., Robertson, M., Lazar, S., Whitfield, H.J., Etheridge, J., Botton, G.A., 2008, Investigation of the hexagonal perovskite Ba3Ti2RuO9 using high-resolution STEM and high resolution EELS, Proceedings Microscopy and Microanalysis 2008, 2nd September 2008 - 5th September 2008, Cambridge University Press, Cambridge, UK, pp. 1342-1343.

Nakashima, P., Moodie, A.F., Etheridge, J., 2008, Solving the phase problem and determining structure amplitudes by inspecting 3-Beam CBED patterns, Through the Looking Glass - The 20th Australian Conference on Microscopy and Microanalysis and the 4th Congress of the International Union of Microbeam Analysis Societies (Proceedings), 10th - 15th February 2008, The Australian Microscopy and Microanalysis Society Inc., Melbourne, Victoria, Australia, p. 295.

Etheridge, J., Maunders, C., Moodie, A.F., Nakashima, P., Rossouw, C.J., 2006, Novel CBED Methods for Structural Analysis, Microscopy and MIcroanalysis, 30th July - 3rd August 2006, CUP, Cambridge UK, pp. 792CD-793CD.

Postgraduate Research Supervisions

Current Supervision

Program of Study:

(DOCTORATE BY RESEARCH).

Thesis Title:

New Methods for Measuring Crystal Structure and Bonding By "3-Beam" Convergent Electron Diffraction.

Supervisors:

Etheridge, J (Main), Nakashima, P (Associate).

Program of Study:

(DOCTORATE BY RESEARCH).

Thesis Title:

Relationship between Particle Geometry and Surface Plasmon Resonance of Noble Metal Nanoparticles.

Supervisors:

Funston, A (Main), Etheridge, J (Associate).

Program of Study:

(DOCTORATE BY RESEARCH).

Thesis Title:

Structure-Property Relationships of Metallic Nano-Particles using Advanced Electron Microscopy.

Supervisors:

Etheridge, J (Main), Funston, A (Associate).

Completed Supervision

Student:

Heenetigala, D.

Program of Study:

Local atomic structure of high Tc superconductors. (PHD) 2008.

Supervisors:

Etheridge, J (Main).

Student:

Katz-Boon, H.

Program of Study:

A method for the characterisation of gold nano-rods. (PHD) 2010.

Supervisors:

Etheridge, J (Main).

Student:

Maunders, C.

Program of Study:

ATOMIC AND ELECTRONIC STRUCTURE OF HEXAGONAL PEROVSKITES, Ba3Ti2MO9 M=Mn, Ru, USING ELECTRON DIFFRACTION AND MICROSCOPY. (PHD) 2005.

Supervisors:

Etheridge, J (Main), Muddle, B (Associate).

Student:

Shih, J.

Program of Study:

Investigation of the Formation of Nd2Fe14B and Nd2Fe23B3 in Nd-Fe-B Nanocomposite Hard Magnetic Materials. (Masters) 2007.

Supervisors:

Suzuki, K (Main), Etheridge, J (Associate).