6 points, SCA Band 2, 0.125 EFTSL
Undergraduate - Unit
Refer to the specific census and withdrawal dates for the semester(s) in which this unit is offered.
Dr Melanie Ooi
Not offered in 2018
Electronic testing in IC fabrication cycle; the importance and organisation of testing within technological process; test equipment used in industry to verify the correct operation of digital integrated circuits (generic architecture and operation of a test system, main modules of a tester and their operation, computer-aided test engineering tools, test system programming, device interface board design), digital test methodologies (DC parametric, AC, functional and IDDQ tests), semiconductor memory testing, introduction to analogue and mixed-signal testing, design-for-testability and built-in self-test and their implication on test technology, test data collection and analysis.
Upon successful completion of the unit, students are expected to:
- Develop and justify the requirements of different integrated circuit testing procedures such as parametric, functional, IDDQ, memory, design for test and built-in self test based on manufacturer's specifications and real-world production issues through thorough understanding of microelectronics evolution, fabrication and manufacturing processes, and the cost and roles of testing
- Evaluate and select the optimal test for printed circuit boards through a deep comprehension of ATE architecture and familiarity with real-world test equipment.
Continuous assessment: 40% + Examination (2 hours): 60%
Students are required to achieve at least 45% in the total continuous assessment component (assignments, tests, mid-semester exams, laboratory reports) and at least 45% in the final examination component and an overall mark of 50% to achieve a pass grade in the unit. Students failing to achieve this requirement will be given a maximum of 45% in the unit.
3 hours lectures, 1 hour tutorials, 2 hours laboratories and 6 hours private study per week
See also Unit timetable information